{"id":28038,"date":"2025-03-11T20:07:05","date_gmt":"2025-03-11T12:07:05","guid":{"rendered":"https:\/\/centrumtw.com\/products\/semiconductor\/auto-ir-aoi-measurement-for-penetrate-si-inspection\/"},"modified":"2026-08-24T15:51:15","modified_gmt":"2026-08-24T07:51:15","slug":"ir-inspection-overlay-crack-silicon-structure","status":"publish","type":"page","link":"https:\/\/centrumtw.com\/en\/products\/semiconductor\/ir-inspection-overlay-crack-silicon-structure\/","title":{"rendered":"IR Inspection Overlay Crack Silicon Structure"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"28038\" class=\"elementor elementor-28038 elementor-4465\">\n\t\t\t\t<div class=\"elementor-element elementor-element-259e221 thegem-e-con-layout-thegem e-flex e-con-boxed e-con e-parent\" data-id=\"259e221\" data-element_type=\"container\" data-settings=\"{&quot;thegem_container_layout&quot;:&quot;thegem&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-167b86d e-con-full thegem-e-con-layout-thegem e-flex e-con e-child\" data-id=\"167b86d\" data-element_type=\"container\" data-settings=\"{&quot;thegem_container_layout&quot;:&quot;thegem&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-af77f4e flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-widget elementor-widget-heading\" data-id=\"af77f4e\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<span class=\"elementor-heading-title elementor-size-default\">Semiconductor::IR Inspection Overlay Crack Silicon Structure\n<\/span>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-2d4e8fd flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-widget elementor-widget-heading\" data-id=\"2d4e8fd\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"styled-subtitle elementor-heading-title elementor-size-default\">Penetrating Silicon Sub-Surface: Mastering Invisible Defect Risks\n\n<\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-be5fc35 flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-widget elementor-widget-text-editor\" data-id=\"be5fc35\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\r\n\t\t\t\t\t\t<p style=\"text-align: left;\">In advanced packaging processes, critical defects such as inner cracks, chipping, overlay shift, and embedded foreign particles within the die are completely concealed beneath the surface. Relying solely on conventional surface AOI creates severe inspection blind spots, compromising downstream process validation and high-volume manufacturing (HVM) yield.Leveraging the physical transmission characteristics of infrared light through silicon.\u00a0<br \/><b style=\"color: #000000;\">Centrum Technology IR Metrology &amp; Inspection System<\/b> is dedicated to deep, non-destructive inspection of silicon wafers and dies. Without sample destruction, the system achieves precise internal structural characterization, defect depth profiling, and in-line process quality control\u2014drastically shortening root-cause traceability cycles and maximizing defect disposition efficiency.<\/p>\t\t\t\t\t\t\t<\/div>\r\n\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-6a5efae e-con-full thegem-e-con-layout-thegem e-flex e-con e-child\" data-id=\"6a5efae\" data-element_type=\"container\" data-settings=\"{&quot;thegem_container_layout&quot;:&quot;thegem&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-7ce257d flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-invisible elementor-widget elementor-widget-image\" data-id=\"7ce257d\" data-element_type=\"widget\" data-settings=\"{&quot;_animation&quot;:&quot;fadeInRight&quot;}\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img fetchpriority=\"high\" width=\"672\" height=\"372\" src=\"https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/08\/ChatGPT-Image-2026\u5e747\u67088\u65e5-\u4e0b\u534805_37_05-672x372.png\" class=\"attachment-post-thumbnail size-post-thumbnail wp-image-30493\" alt=\"\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-274b8ce thegem-e-con-layout-thegem e-flex e-con-boxed e-con e-parent\" data-id=\"274b8ce\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;,&quot;thegem_container_layout&quot;:&quot;thegem&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-95a485a e-con-full thegem-e-con-layout-thegem e-flex e-con e-child\" data-id=\"95a485a\" data-element_type=\"container\" data-settings=\"{&quot;thegem_container_layout&quot;:&quot;thegem&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-e04d2af flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-invisible elementor-widget elementor-widget-image\" data-id=\"e04d2af\" data-element_type=\"widget\" data-settings=\"{&quot;_animation&quot;:&quot;slideInDown&quot;}\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img width=\"768\" height=\"576\" src=\"https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/08\/ChatGPT-Image-2026\u5e747\u67088\u65e5-\u4e0b\u534805_14_13-768x576.png\" class=\"attachment-medium_large size-medium_large wp-image-30494\" alt=\"\" srcset=\"https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/08\/ChatGPT-Image-2026\u5e747\u67088\u65e5-\u4e0b\u534805_14_13-768x576.png 768w, https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/08\/ChatGPT-Image-2026\u5e747\u67088\u65e5-\u4e0b\u534805_14_13-300x225.png 300w, https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/08\/ChatGPT-Image-2026\u5e747\u67088\u65e5-\u4e0b\u534805_14_13-1024x768.png 1024w, https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/08\/ChatGPT-Image-2026\u5e747\u67088\u65e5-\u4e0b\u534805_14_13.png 1448w\" sizes=\"(max-width: 768px) 100vw, 768px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-bd28878 e-con-full thegem-e-con-layout-thegem e-flex e-con e-child\" data-id=\"bd28878\" data-element_type=\"container\" data-settings=\"{&quot;thegem_container_layout&quot;:&quot;thegem&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-5c702f7 flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-widget elementor-widget-heading\" data-id=\"5c702f7\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"styled-subtitle elementor-heading-title elementor-size-default\">Core Technology Highlights \n\n<\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-1f61451 flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-widget elementor-widget-text-editor\" data-id=\"1f61451\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\r\n\t\t\t\t\t\t<ul><li><b>Advanced Short-Wave Infrared (SWIR \/ IR) Silicon Penetration Technology<\/b><\/li><li><b>100% Non-Destructive Testing (NDT):<\/b> Zero damage to wafer samples.<\/li><li><b>High-Resolution Sub-Surface Structural Imaging, Defect Characterization &amp; In-Line Quality Control<\/b><\/li><\/ul>\t\t\t\t\t\t\t<\/div>\r\n\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Semiconductor::IR Inspection Overlay Crack Silicon Structure Penetrating Silicon Sub-Surface: Mastering Invisible Defect Risks In advanced packaging processes, critical defects such&#8230;<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":27971,"menu_order":3,"comment_status":"closed","ping_status":"closed","template":"page-fullwidth.php","meta":{"footnotes":""},"class_list":["post-28038","page","type-page","status-publish"],"_links":{"self":[{"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/pages\/28038","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/comments?post=28038"}],"version-history":[{"count":9,"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/pages\/28038\/revisions"}],"predecessor-version":[{"id":30499,"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/pages\/28038\/revisions\/30499"}],"up":[{"embeddable":true,"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/pages\/27971"}],"wp:attachment":[{"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/media?parent=28038"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}