{"id":30665,"date":"2026-08-26T16:00:05","date_gmt":"2026-08-26T08:00:05","guid":{"rendered":"https:\/\/centrumtw.com\/?page_id=30665"},"modified":"2026-08-28T10:03:03","modified_gmt":"2026-08-28T02:03:03","slug":"abf-film-thickness-metrology","status":"publish","type":"page","link":"https:\/\/centrumtw.com\/en\/products\/ic-substrate\/abf-film-thickness-metrology\/","title":{"rendered":"ABF Film Thickness Metrology System"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"30665\" class=\"elementor elementor-30665\">\n\t\t\t\t<div class=\"elementor-element elementor-element-259e221 thegem-e-con-layout-thegem e-flex e-con-boxed e-con e-parent\" data-id=\"259e221\" data-element_type=\"container\" data-settings=\"{&quot;thegem_container_layout&quot;:&quot;thegem&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-167b86d e-con-full thegem-e-con-layout-thegem e-flex e-con e-child\" data-id=\"167b86d\" data-element_type=\"container\" data-settings=\"{&quot;thegem_container_layout&quot;:&quot;thegem&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-af77f4e flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-widget elementor-widget-heading\" data-id=\"af77f4e\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<span class=\"elementor-heading-title elementor-size-default\">IC Substrate:ABF Film Thickness Metrology System<\/span>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-2d4e8fd flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-widget elementor-widget-heading\" data-id=\"2d4e8fd\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<span class=\"elementor-heading-title elementor-size-default\">High-Precision ABF Dielectric Layer Metrology: Building a Stable and Reliable Advanced Packaging Metrology Platform\n\n\n<\/span>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-54bf908 flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-widget elementor-widget-text-editor\" data-id=\"54bf908\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\r\n\t\t\t\t\t\t<p>In advanced packaging and multi-layer build-up processes, tool stability and metrology accuracy depend not only on the inspection system itself, but are also closely tied to interlayer material structures, copper layer alignment, high-frequency dielectric thickness control, measurement precision, and manufacturing yield enhancement. Accurately targeting and measuring ABF Film thickness is critical to ensuring signal transmission integrity and structural stability in high-end chip packaging.<\/p><p>Leveraging specialized optical metrology and proprietary algorithm development capabilities, Centrum Technology delivers customized high-precision advanced packaging metrology systems tailored to customer product specifications, multi-layer stack-ups, and inspection demands. These include ABF Film dielectric layer metrology modules, copper layer thickness profiling, and multi-layer micron-level thickness analysis tools. Specifically, the ABF dielectric layer metrology module accurately locks onto and captures the ABF dielectric thickness between multiple copper layers, satisfying micron-level precision demands and supporting advanced IC substrates as well as 3D advanced packaging metrology applications.<\/p><p>This capability demonstrates Centrum Technology&#8217;s strength not merely as a hardware provider, but in seamlessly integrating multi-layer film thickness measurement, visual feature recognition, optical interferometry, and precision substrate alignment design to help customers build stable and dependable high-volume manufacturing inspection solutions.<\/p>\t\t\t\t\t\t\t<\/div>\r\n\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-6a5efae thegem-e-con-layout-thegem e-flex e-con-boxed e-con e-child\" data-id=\"6a5efae\" data-element_type=\"container\" data-settings=\"{&quot;thegem_container_layout&quot;:&quot;thegem&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-7ce257d flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-widget elementor-widget-image\" data-id=\"7ce257d\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img fetchpriority=\"high\" width=\"887\" height=\"1774\" src=\"https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/07\/ChatGPT-Image-727ABFV2\u76f4.png\" class=\"attachment-full size-full wp-image-30667\" alt=\"\" srcset=\"https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/07\/ChatGPT-Image-727ABFV2\u76f4.png 887w, https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/07\/ChatGPT-Image-727ABFV2\u76f4-150x300.png 150w, https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/07\/ChatGPT-Image-727ABFV2\u76f4-512x1024.png 512w, https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/07\/ChatGPT-Image-727ABFV2\u76f4-768x1536.png 768w\" sizes=\"(max-width: 887px) 100vw, 887px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-274b8ce thegem-e-con-layout-thegem e-flex e-con-boxed e-con e-parent\" data-id=\"274b8ce\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;,&quot;thegem_container_layout&quot;:&quot;thegem&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-95a485a e-con-full thegem-e-con-layout-thegem e-flex e-con e-child\" data-id=\"95a485a\" data-element_type=\"container\" data-settings=\"{&quot;thegem_container_layout&quot;:&quot;thegem&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-e04d2af flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-widget elementor-widget-image\" data-id=\"e04d2af\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img width=\"1024\" height=\"576\" src=\"https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/07\/ChatGPT-Image-727ABF\u6a6b-1024x576.png\" class=\"attachment-large size-large wp-image-30668\" alt=\"\" srcset=\"https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/07\/ChatGPT-Image-727ABF\u6a6b-1024x576.png 1024w, https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/07\/ChatGPT-Image-727ABF\u6a6b-300x169.png 300w, https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/07\/ChatGPT-Image-727ABF\u6a6b-768x432.png 768w, https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/07\/ChatGPT-Image-727ABF\u6a6b-1536x864.png 1536w, https:\/\/centrumtw.com\/wp-content\/uploads\/2026\/07\/ChatGPT-Image-727ABF\u6a6b.png 1672w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-bd28878 e-con-full thegem-e-con-layout-thegem e-flex e-con e-child\" data-id=\"bd28878\" data-element_type=\"container\" data-settings=\"{&quot;thegem_container_layout&quot;:&quot;thegem&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-e89e0fd flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-widget elementor-widget-heading\" data-id=\"e89e0fd\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<span class=\"elementor-heading-title elementor-size-default\">Core Technology Highlights\n\n\n<\/span>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-0b3aef3 flex-horizontal-align-default flex-horizontal-align-tablet-default flex-horizontal-align-mobile-default flex-vertical-align-default flex-vertical-align-tablet-default flex-vertical-align-mobile-default elementor-widget elementor-widget-text-editor\" data-id=\"0b3aef3\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\r\n\t\t\t\t\t\t<ul><li><b>Ultra-High-Precision Layer Thickness Metrology:<\/b> Accurately isolates multi-layer structures with micron-level mechanical and optical measurement accuracy.<\/li><li><b>Deep Multi-Layer Structural Profiling:<\/b> Supports comprehensive metrology for ABF build-up films, copper layers, and structural features.<\/li><li><b>Cross-Sectional Micron Data Visualization:<\/b> Delivers real-time quantification of interlayer interface features to achieve inline process monitoring.<\/li><\/ul>\t\t\t\t\t\t\t<\/div>\r\n\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>IC Substrate:ABF Film Thickness Metrology System High-Precision ABF Dielectric Layer Metrology: Building a Stable and Reliable Advanced Packaging Metrology Platform&#8230;<\/p>\n","protected":false},"author":3,"featured_media":0,"parent":28176,"menu_order":8,"comment_status":"closed","ping_status":"closed","template":"page-fullwidth.php","meta":{"footnotes":""},"class_list":["post-30665","page","type-page","status-publish"],"_links":{"self":[{"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/pages\/30665","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/comments?post=30665"}],"version-history":[{"count":8,"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/pages\/30665\/revisions"}],"predecessor-version":[{"id":31021,"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/pages\/30665\/revisions\/31021"}],"up":[{"embeddable":true,"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/pages\/28176"}],"wp:attachment":[{"href":"https:\/\/centrumtw.com\/en\/wp-json\/wp\/v2\/media?parent=30665"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}