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19th Ave New York, NY 95822, USA

非接觸斷短路測試檢查機

液晶顯示器

非接觸斷短路測試檢查機

專利非接觸式檢測技術用於 ≧ 3 um精細電路檢測
高通量檢測效率(> 99.5%)

LCD OPEN SHORT TESTING MACHINE

Proprietary non-contact inspection technology for fine circuit detection at ≥ 3 µm resolution.
High-throughput inspection efficiency (> 99.5%)