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19th Ave New York, NY 95822, USA

矽光子元件/CPO 檢量測

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矽光子元件/CPO 檢量測

因應人工智慧和高效運算,高速資料傳輸新挑戰,依客戶要求開發各種不同檢測方案。
 •用於矽光子 / CPO 的元件檢測技術。
 •開發晶片型態檢量測。
 •依客戶要求進行實際工作溫度加熱檢測。
 •具備 3D 高解析度視覺檢測技術。

CPO Component Inspection

Photonic Component / CPO Inspection
In response to the growing demands of AI and high-efficiency computing,along with the challenges of high-speed data transmission,we provide customized inspection solutions based on customer requirements.

  • Component inspection technologies for photonics/CPO applications
  • Measurement solutions for various chip form factors
  • Supports elevated temperature testing under real operating conditions per customer request
  • Equipped with advanced 3D high-resolution visual inspection technology