2D AOI measuring System

We offer a wide range of high-precision 2D inspection systems tailored for semiconductor and OSAT production lines. Designed to detect surface defects across all critical process stages.

System Features

● Ultra-high-resolution and high-throughput inspection.
● Dimensional accuracy: ≥ ±1 μm.
● Real-time inspection to prevent yield loss.
● Quantitative defect analysis to minimize false positives.
● AI-assisted defect classification to boost automation.
● Fully customizable configurations and equipment layout.

Applications

● Applicable to any component requiring dimensional or appearance validation.