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High-Accuracy Dimensional Measurement System

IC Substrate:High-Accuracy Dimensional Measurement System
±5 μm High-Precision Full-Dimension Metrology: Proactive Control of Dicing and Edge Quality

The rise of AI applications is driving continuous increases in IC substrate and PCB thickness. Consequently, dicing quality, edge stability, dimensional uniformity, and notch/hole positioning accuracy have become critical determinants of downstream assembly and mass-production yields. Unmonitored dicing offsets or tool wear significantly escalate scrap, rework, and process adjustment costs.Tailored to IC substrate and PCB manufacturing demands,

Centrum Technology High-Precision Dimensional Metrology System provides high-speed, full-dimension inspection capabilities. It supports top/bottom dimensions, panel margins (rails), cut edges, and notch/hole alignments with an exceptional metrology accuracy of up to ±5 μm.

The system also features an intelligent early-warning mechanism that predicts tool wear trends and maintenance timing, transforming dimensional inspection from a passive quality check into an active process control tool. Through real-time quantitative inspection data, it empowers production lines to enhance yields, mitigate downtime risks, and reinforce quality assurance throughout the dicing process.

Core Technology Highlights
  • Industrial-Grade Extreme Metrology Precision: Delivers high-precision full-dimension inspection down to ±5 μm.
  • Comprehensive Inspection Coverage: Fully supports front/back dimensions, panel margins, dicing edge defects, and notch/hole position metrology.
  • Intelligent Early-Warning System: Monitors real-time data trends to predict cutting tool wear and optimize maintenance schedules.