Built-in Capacitor Test

【Development Background】

To address the challenges of high-power consumption and elevated temperatures in AI applications, the use of embedded components within substrates is steadily increasing—driving greater demand for electrical testing. In response, we have integrated LCR measurement capabilities directly into our electrical testing systems.

【Technical Highlights】

-Built-in LCR measurement module, enabling combined open/short and embedded component electrical testing.
-Significantly improves overall test efficiency and system stability.