【Patent and Technology Breakthroughs】
2018.08 Obtained invention patent for “Method and Apparatus for Testing Thin-Film Transistor Substrates.”
2018.08 Obtained invention patent (II) for “Method and Apparatus for Detecting Defects in Thin-Film Transistor Panels.”
2018.08 Established AI R&D Team, introducing AI technology application and development.
2018.08 Initiated the development of an intelligent OST inspection system to enhance technical capabilities.
2017.09 Obtained a utility model patent for “Inspection Apparatus for Determining the Quality of a Conductive Pattern.”
2017.09 Obtained invention patent (I) for “Method and Apparatus for Detecting Defects in Thin-Film Transistor Panels.”
2017.05 Obtained invention patent (II) for “Jig Adjustment Method.”