半導體
IR檢量測系統
IR檢量測系統
興城提供IR 檢量測系統,穿透矽晶體進行相關缺陷的檢量測方案,針對現行半導體與封裝製程中,晶圓內部缺陷、Overlay、Die 於製程中的缺陷檢測。
Auto IR AOI Measurement for Penetrate Solder Si Inspection
IR Inspection System
We offer IR inspection systems capable of penetrating silicon to detect internal structural defects.
Detects defects such as inner cracks, Chipping in wafer, overlay misalignment, and die-related process issues