Liquid crystal display (LCD) and fine-pitch circuit manufacturing processes demand exceptionally high precision and stability for open/short inspection. As line dimensions shrink to the micron level, conventional contact-based probing faces critical challenges, including unstable contact resistance, surface damage to samples, and throughput limitations.
The Centrum Technology Non-Contact Open/Short Tester utilizes patented non-contact sensing technology to execute high-speed open/short testing on fine-pitch circuits down to >= 3 μm. Operating without physical contact with the sample surface, the system accurately detects electrical anomalies while eliminating probe-induced damage and contact-related measurement errors.
Through high-throughput inspection efficiency and a highly stable non-contact architecture, this solution is tailored to the mass-production testing demands of LCDs and fine-line circuitry, empowering customers to improve test stability and outgoing product quality.
- Patented Non-Contact Electrical Testing Core: Eliminates probe contact to protect fine-line surfaces from physical damage.
- Ultimate Fine-Pitch Capability: Fully supports micron-level circuit testing down to >= 3 μm.
- Overall Inspection Performance > 99.5%